AMORPH: A statistical program for characterizing amorphous materials by X-ray diffraction
نویسندگان
چکیده
منابع مشابه
X-ray diffraction: a powerful method of characterizing nanomaterials
X-ray diffraction techniques are a very useful characterization tool to study, non-destructively, the crystallographic structure, chemical composition and physical properties of materials and thin films. It can also be used to measure various structural properties of these crystalline phases such as strain, grain size, phase composition, and defect structure. XRD is also used to determine the t...
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ژورنال
عنوان ژورنال: Computers & Geosciences
سال: 2018
ISSN: 0098-3004
DOI: 10.1016/j.cageo.2018.07.004